International Conference “Scanning Probe Microscopy 2017”
Ostec Instruments Company attended the International Conference “Scanning Probe Microscopy 2017” on August 28-30, 2017 in Ekaterinburg.
SPM-2017 welcomed about 150 participants from 8 countries and 24 cities of Russia. The conference witnessed 9 industrial, 14 invited, 44 oral, and 104 poster presentations.
We were pleased to take part in exchange of ideas concerning actual status and development prospects of Scanning Probe Microscopy in various fields of science.
Our colleagues participated the equipment exhibition and gave two oral reports:
- «Innovative Solutions to Protect Scientific and Technological Equipment from Vibrations»;
- «Reducing the Influence of Surface Roughness on Hardness Measurement Using Instrumented Indentation Test».
The conference proceedings can be found in the special issues of the trade magazines IOP Conference Series: Materials Science and Engineering and FERROELECTRICS.