-
Products
- Gas analysis systems
- GAOS SENSON gas analyzers
- GAOS MS process mass spectrometry
- MaOS HiSpec ion mobility spectrometer
- MaOS AxiSpec ion mobility spectrometer
- Applications
- News
- Events
- About us
XROS MF30 – laboratory x-ray microscope-microprobe for studies of the objects by the methods of the optical microscopy, radiography, local element XRF microanalysis with possibility of the element mapping.
Using a microscope, a sample of up to 400 mm in size along the Y axis and of unlimited size along the X axis (max. scan area 150×150 mm; in the case of a larger area, the scanned areas can be stitched) and up to 105 mm high can be performed.
An overview video camera and two optical microscopes with magnification up to 200 times are using for accurate determination of the scanning area.
The central optical microscope with automated sharpness adjustment is combined with the axis of the microprobe (axis of the x-ray beam).
Local X-ray fluorescence microanalysis with the possibility of elemental mapping and X-ray studies can be carried out both separately and simultaneously.
Sample positioning accuracy is 10 microns.
The minimum diameter of the x-ray probe is 30 µm.
The range of simultaneously measured elements from 11Na to 92U.
Samples: banknote with a nominal value of 1000 RUB.
Size of scan area allows to investigate all the banknote in one scan without moving the sample.
XROS MF30 x-ray analytical microscope-microprobe allows to analyze the material of banknotes for the distribution of various elements in it with a high spatial resolution and elemental sensitivity.
Scan step |
400 µm |
Electric current |
7 000 µA |
Scan rate |
400 µm/s |
XRT |
Mo anode |
Measurement time |
1 000 ms |
Atmosphere |
Air |
Voltage |
30 kV |
|