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The analysis demonstrated a possibility to analyze solders to measure Pb, Sn, Ag, Sn, Cd composition. To make quantitative analysis it is necessary to make CRMs.
Microscope-microprobe XROS MF30 allows analyzing PCB by IЕС 62321-3-1-201 with element distribution map.
The analysis demonstrated the presence of traces of lead, chrome, cadmium, bromine in the PCB. These elements should be monitored according to IЕС 62321-3-1-201. It was also determined their distribution through PCB. Semiquantitative analysis was done by fundamental parameter method.