Products

IROS P Based Analyzers

IROS P01 based FTIR spectrometer for fuel analysis


IROS P01 based FTIR Spectrometers for Fuel Analysis

IROS P01 FTIR spectrometer combined with autosampler extension module and PFSpec + PAPetro software modules are used for on-line fuel quality control: oxygenates and benzol detection in petrol and aviation benzene.


Analyzer root principle


  • Analyzed probe spectrum comparison to the calibration mixture (of known oxygenates and benzene content in petrol) spectrum
  • Rapid analysis: one probe < 2 min
  • Analyzer is factory calibrated in accordance with ASTM E1655
  • For calibration verification samples prepared in accordance with ASTM D4307 are used

IROS PAPetro software features

  • Petrol probe injection through autosampler with an integrated peristaltic pump
  • Automatic basic IR spectrum detection using a comparison sample in a separate cell
  • Flow-cell sample and solvent rinse
  • IR spectra registration and mathematical treatment
  • Report preparation and data backup
  • Analysis results print output 

Oxygenates measurement range and accuracy in accordance with ASTM D5845


Analyte Measurement range, w/w, % Standard deviation, %
MTBE

0.1 – 20

0.9

ETBE

0.1 – 20

0.75

TAME

0.1 – 20

1.2

DIPE

0.1 – 20

0.6

Methanol

0.1 – 6.0

0.25

Ethanol

0.1 – 11

0.4

TBA

0.1 – 14

0.55

Propanol

0.1 – 10

0.5

IPA

0.1 – 10

0.5

MMA

0.1 – 5.0

0.3

Oxygenates and benzol detection in petrol:

IR spectra analysis is performed via multi-dimensional least-squares method of IROS PAPetro software.

IROS P01 IR spectrometer for electrical insulating mineral oil monitoring


IROS P01 IR Spectrometer for Electrical Insulating Mineral Oil Monitoring

Combination of IROS P01 FTIR spectrometer, demountable liquid cell (with KBr window) and РASpec software allows to implement consistent procedure for identification and quantitative assay of the antioxidant in insulating oil concerning ASTM D2668-07(2013) “Mineral insulating oils. Detection and determination of specified additives”.


Liquid cell should be chosen depending on a task and probe properties. It can be demountable or one-piece, with proper optical path length and window material clear in the needed spectral range.


Liquid cell is filled with a probe and is put inside the spectrometer cell compartment.


РASpec software is installed into basic PFSpec software and includes the following functions:
  • generation of a calibrating model
  • qualitative and quantitative assays
  • generation of data archive
  • edit printout of measurement reports

РASpec software has a built-in editor of macroexpansion instructions for automation of measurements and a report editor.

Basic analysis stages:


  1. Samples shall be collected as per ASTM D 923 “Standard Practice for Sampling Electrical Insulating Liquids”
  2. Registration of absorption spectrum of the base oil-free of the inhibitor (AO)
  3. Registration of absorption spectrum of the sample (А)
  4. Quantitative analysis of IR spectra, CLS method Absorbance = А – АО
  5. Identification of the inhibitor type on the basis of absorption features: DBPC – 860 cm-1, DBP – 750 cm-1
  6. Region of spectrum for quantitative assay 3 675 – 3 625 cm-1, with calculation of % wt. of the inhibitor

IROS P accessories


An important feature of insulating oils used in power equipment in the course of the long-term operation is their oxidation stability. Phenolic antioxidants of butylated hydroxytoluene (BHT) type (2,6 di-tretbutyl-para-cresol, DBPC) is a lipophilic organic compound, chemically a derivative of phenol, that is useful for its antioxidant properties. Recommended content of additive in oil as per IEEC 60296:2003 “Fluids for electrotechnical applications. Unused mineral insulating oils for transformers and switchgear. Specifications” varies from 0.25 to 0.4 % wt.


Features

  • Automation of measurements including start testing and self-diagnostics
  • Automatic calculation of the oil parameters on the basis of the calibrating model
  • Interactive “button” control interface

IROS P01F FTIR fluid analyzer with НATR flow-cell


IROS P01F is the system with a multi-reflective ATR horizontal measuring flow cell based on IROS P01 classic IR Fourier spectrometer. The optical design does not require alignment. The system block is leaktight, which prevents the entry of water vapor and other substances from the surrounding atmosphere. The flow cell is removable, which allows quick cleaning and maintenance. The system may include both a crystal mounted at the surface level and a crystal recessed into the housing.


The HATR crystal is integrated into the upper cover of the device. The design is leaktight, which simplifies the maintenance of the flow cell. The cover with the crystal is also removable, which makes it easy to carry out maintenance of the cell, replacing the crystal if necessary.


IROS P01F FTIR fluid analyzer with НATR flow-cell

Features

  • Available with various crystals (Ge, ZnSe, etc.)

  • Leaktight design

  • Easy to maintain

  • Removable cell with the ability to clean and replace the crystal

Flow inlets 


The flow analysis of various liquid substances is a crucial task in many industries. Carrying out automatic screening in the flow cell of an IR-Fourier spectrometer integrated into the production line allows to obtain valuable data on the processes occurring in real time, without delays which cannot be avoided during the analysis by an autonomous method with sampling. This allows you to minimize risks and reduce time costs to obtain the necessary results.


Specification


Spectral range, cm-1

5 500 – 600 (with Ge)

7 800 – 550 (with ZnSe)

Spectral resolution, cm-1

1,0 (0,5 on request)

Detectors

LiTaO3 (DLaTGS on request)

HATR module

Ge, 45° (ZnSe and other on request)

Power supply

220 V, 50 Hz

Consumed power (without PC), W

60

Weight, kg

32

Dimensions, mm

290х490х250


IROS P03 based FTIR spectrometer for atmospheric composition analysis


IROS P03 based FTIR Spectrometer for Atmospheric Composition Analysis

IROS P03 FTIR spectrometer combined with gas cell and PFSpec + PASpec software modules are used for atmospheric composition analysis.


Climate active gases detection in the air: CH4, CO, CO2, H2O, N2O


Sensitivity limit < 0.1 ppm


IROS P03 spectrometer-based gas analyzer has 2 registration channels:

  • Multi-pass gas cell, optical path length of 40 m, surface air quantity analysis with discrete sample collection

  • Optical port for solar radiation (radiometric unit), gas component concentration detection in higher atmospheric layers

This configuration with other gas cells allows us to detect and analyze multi-component gas mixtures, pure gases, organic solvent vapors, etc.


Depending on a gas mixture needed component concentration simple or multi-pass cells are being used (the optical path is from 100 mm to 40 m).


If there is a risk of vapor condensation, a temperature-controlled cell and heated up to 250 °С gas line is being used.


For air (remote sensing) track measurements are being conducted (radiometric unit for spectrometer).

Multi-pass gas cells
Fixed optical length gas cell
Thermostable gas cell

Detection limits (3σ)*, ppm

CO2

1.0

CH4

0.02

CO

0.05

N2O

0.004

* – multi-pass gas cell, 40 m

IROS P01W FTIR semiconductor wafer analyzer


IROS P01W FTIR spectrometer is a dedicated silicon wafer analyzer with a dual detector design and a fully computer-controlled sample table. It is designed for automated testing of silicon wafer parameters according to a profiling pattern given by the operator. Wafer sizes up to 200 mm can be accommodated.


IROS P01W is based on a classic IROS P01 FTIR spectrometer with a Michelson interferometer scheme.

IROS P01W FTIR Semiconductor Wafer Analyzer

FTIR spectroscopy is a powerful tool for non-destructive characterization of semiconductor wafers and structures. This is confirmed by a number of standards, recognized worldwide, such as SEMI MF1188 and SEMI MF1391, introducing test methods for interstitial oxygen and substitutional carbon content in silicon, or SEMI MF95 describing test method for thickness of epitaxial layers of n-n+ or p-p+ type silicon structures. Also, determination of phosphorous and/or boron concentrations in PSG/BPSG layers is possible, or SOI structures and dielectric films characterization.


Characterized parameters

  • Interstitial oxygen concentration in silicon (wafer thickness 0.4–2 mm): (5x1015–2x1018) ±5x1015 cm-3 (SEMI MF1188)

  • Substitution carbon concentration in silicon (wafer thickness 0.4–2 mm): (1016–5x1017) ±1016 cm-3 (SEMI MF1391)

  • Radial interstitial oxygen variation in silicon wafers (SEMI MF951)

  • Thickness of epitaxial layers for silicon n-n+ and p-p+ structures: (0.5–10)±0.1 mm, (10–200)±1% mm (SEMI MF95)

  • Thickness of silicon epitaxial layers for SOS structures: (0.1–10)±1% mm

  • Boron and/or phosphorus concentration in BPSG/PSG on silicon: (1–10)±0.2 wt. %


Features

  • High efficiency. Measurement time for routine spectral resolution and photometric accuracy parameters does not exceed 15-20 sec. It permits not only random but also complete process testing of product wafers and structures. Assessment of the wafer non-uniformity is made possible by the use of profiling of the material parameters.

  • Analysis reliability. Identification and analyses are based on the whole spectrum simulation utilizing reference spectral library, and PLS optimization procedures.

  • Non-destructive measurements. IR optical measurements are by nature non-contact and non-contaminating.

  • Automated testing process. All the testing operations covering spectra acquisition, analysis, sample table transport, are computer controlled. Profiling options include standard 1-, 5-, and 9-point star configurations, as well as operator-programmed patterns. Results of the wafer testing are automatically logged into a database.

  • Easy installation and service. Due to advanced design, spectrometer does not require cooling water or pressurized air.


Specification


Spectral range, cm-1

7 800 – 400

Spectral resolution, cm-1

1.0

IR beam diameter on the wafer, mm

6

Maximum wafer diameter, mm

200

Table positioning accuracy, mm

0,5

Basic measurement time at one point, sec

20

Beam splitter

KBr with Ge-based coating

Emitting source

High temperature ceramic-metal

Detector

LiTaO3 pyroelectric detector

Dimensions, mm

670x650x250

Weight, kg

37