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IROS P01 FTIR spectrometer combined with autosampler extension module and PFSpec + PAPetro software modules are used for on-line fuel quality control: oxygenates and benzol detection in petrol and aviation benzene.
Analyzer root principle
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Analyte | Measurement range, w/w, % | Standard deviation, % |
MTBE |
0.1 – 20 |
0.9 |
ETBE |
0.1 – 20 |
0.75 |
TAME |
0.1 – 20 |
1.2 |
DIPE |
0.1 – 20 |
0.6 |
Methanol |
0.1 – 6.0 |
0.25 |
Ethanol |
0.1 – 11 |
0.4 |
TBA |
0.1 – 14 |
0.55 |
Propanol |
0.1 – 10 |
0.5 |
IPA |
0.1 – 10 |
0.5 |
MMA |
0.1 – 5.0 |
0.3 |
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Combination of IROS P01 FTIR spectrometer, demountable liquid cell (with KBr window) and РASpec software allows to implement consistent procedure for identification and quantitative assay of the antioxidant in insulating oil concerning ASTM D2668-07(2013) “Mineral insulating oils. Detection and determination of specified additives”.
Liquid cell should be chosen depending on a task and probe properties. It can be demountable or one-piece, with proper optical path length and window material clear in the needed spectral range.
Liquid cell is filled with a probe and is put inside the spectrometer cell compartment. |
Basic analysis stages:
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An important feature of insulating oils used in power equipment in the course of the long-term operation is their oxidation stability. Phenolic antioxidants of butylated hydroxytoluene (BHT) type (2,6 di-tretbutyl-para-cresol, DBPC) is a lipophilic organic compound, chemically a derivative of phenol, that is useful for its antioxidant properties. Recommended content of additive in oil as per IEEC 60296:2003 “Fluids for electrotechnical applications. Unused mineral insulating oils for transformers and switchgear. Specifications” varies from 0.25 to 0.4 % wt.
IROS P01F is the system with a multi-reflective ATR horizontal measuring flow cell based on IROS P01 classic IR Fourier spectrometer. The optical design does not require alignment. The system block is leaktight, which prevents the entry of water vapor and other substances from the surrounding atmosphere. The flow cell is removable, which allows quick cleaning and maintenance. The system may include both a crystal mounted at the surface level and a crystal recessed into the housing.
The HATR crystal is integrated into the upper cover of the device. The design is leaktight, which simplifies the maintenance of the flow cell. The cover with the crystal is also removable, which makes it easy to carry out maintenance of the cell, replacing the crystal if necessary.
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Features
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The flow analysis of various liquid substances is a crucial task in many industries. Carrying out automatic screening in the flow cell of an IR-Fourier spectrometer integrated into the production line allows to obtain valuable data on the processes occurring in real time, without delays which cannot be avoided during the analysis by an autonomous method with sampling. This allows you to minimize risks and reduce time costs to obtain the necessary results.
Spectral range, cm-1 |
5 500 – 600 (with Ge) 7 800 – 550 (with ZnSe) |
Spectral resolution, cm-1 |
1,0 (0,5 on request) |
Detectors |
LiTaO3 (DLaTGS on request) |
HATR module |
Ge, 45° (ZnSe and other on request) |
Power supply |
220 V, 50 Hz |
Consumed power (without PC), W |
60 |
Weight, kg |
32 |
Dimensions, mm |
290х490х250 |
IROS P03 FTIR spectrometer combined with gas cell and PFSpec + PASpec software modules are used for atmospheric composition analysis.
Climate active gases detection in the air: CH4, CO, CO2, H2O, N2O
Sensitivity limit < 0.1 ppm
IROS P03 spectrometer-based gas analyzer has 2 registration channels:
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This configuration with other gas cells allows us to detect and analyze multi-component gas mixtures, pure gases, organic solvent vapors, etc.
Depending on a gas mixture needed component concentration simple or multi-pass cells are being used (the optical path is from 100 mm to 40 m).
If there is a risk of vapor condensation, a temperature-controlled cell and heated up to 250 °С gas line is being used.
For air (remote sensing) track measurements are being conducted (radiometric unit for spectrometer). |
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Detection limits (3σ)*, ppm |
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CO2 |
1.0 |
CH4 |
0.02 |
CO |
0.05 |
N2O |
0.004 |
IROS P01W FTIR spectrometer is a dedicated silicon wafer analyzer with a dual detector design and a fully computer-controlled sample table. It is designed for automated testing of silicon wafer parameters according to a profiling pattern given by the operator. Wafer sizes up to 200 mm can be accommodated.
IROS P01W is based on a classic IROS P01 FTIR spectrometer with a Michelson interferometer scheme.
FTIR spectroscopy is a powerful tool for non-destructive characterization of semiconductor wafers and structures. This is confirmed by a number of standards, recognized worldwide, such as SEMI MF1188 and SEMI MF1391, introducing test methods for interstitial oxygen and substitutional carbon content in silicon, or SEMI MF95 describing test method for thickness of epitaxial layers of n-n+ or p-p+ type silicon structures. Also, determination of phosphorous and/or boron concentrations in PSG/BPSG layers is possible, or SOI structures and dielectric films characterization.
Interstitial oxygen concentration in silicon (wafer thickness 0.4–2 mm): (5x1015–2x1018) ±5x1015 cm-3 (SEMI MF1188)
Substitution carbon concentration in silicon (wafer thickness 0.4–2 mm): (1016–5x1017) ±1016 cm-3 (SEMI MF1391)
Radial interstitial oxygen variation in silicon wafers (SEMI MF951)
Thickness of epitaxial layers for silicon n-n+ and p-p+ structures: (0.5–10)±0.1 mm, (10–200)±1% mm (SEMI MF95)
Thickness of silicon epitaxial layers for SOS structures: (0.1–10)±1% mm
High efficiency. Measurement time for routine spectral resolution and photometric accuracy parameters does not exceed 15-20 sec. It permits not only random but also complete process testing of product wafers and structures. Assessment of the wafer non-uniformity is made possible by the use of profiling of the material parameters.
Analysis reliability. Identification and analyses are based on the whole spectrum simulation utilizing reference spectral library, and PLS optimization procedures.
Non-destructive measurements. IR optical measurements are by nature non-contact and non-contaminating.
Automated testing process. All the testing operations covering spectra acquisition, analysis, sample table transport, are computer controlled. Profiling options include standard 1-, 5-, and 9-point star configurations, as well as operator-programmed patterns. Results of the wafer testing are automatically logged into a database.
Spectral range, cm-1 |
7 800 – 400 |
Spectral resolution, cm-1 |
1.0 |
IR beam diameter on the wafer, mm |
6 |
Maximum wafer diameter, mm |
200 |
Table positioning accuracy, mm |
0,5 |
Basic measurement time at one point, sec |
20 |
Beam splitter |
KBr with Ge-based coating |
Emitting source |
High temperature ceramic-metal |
Detector |
LiTaO3 pyroelectric detector |
Dimensions, mm |
670x650x250 |
Weight, kg |
37 |