Products

Application fields

o Control of surface defect depth

o Measurement of surface roughness after mechanical, ionic treatment

o Caliber measurement (in microrange and nanorange)

o Measurement of surface nanohoughness

o Measurement of structures with a height of one interatomic spacing of a silicon crystal lattice

o Investigation of thin film deposition process - thin film thickness measurement on the witness sample

o Investigation of the surface treatment process in the nanoscale range - measurement of surface nano roughness before and after processing


Palladium film on the silicon substrate, average thickness ~ 120 nm

Chromium film on the glass substrate, average thickness ~ 66 nm


Prosthesis of hip joint head: a – measured surface (color bar’s period is 60 nm), b – filtered result of a (measured roughness Sa = 3,7 nm)


Caliber, the metric of roughness Rz, industrial standard 1^st category, nominal value 101 nm ± 3%

	Echelon of atomic steps

Terraces on the surface of Si crystal

Terraces on the surface of Si crystal, height 0,314 nm


	Certified height caliber 40 ± 1,2 µm
$Diffraction element – Fresnel lens$	$Diffraction element – Fresnel lens, cross-section$
$Diffraction element – Fresnel lens$	Diffraction element – Fresnel lens
$Diffraction element, height 3,7 µm$	Diffraction element, height 3,7 µm
$Diffraction element$	$Diffraction element$
$Diffraction element$	Diffraction element, height 3,7 µm

	Defect of a cylindrical surface