-
Products
- Gas analysis systems
- GAOS SENSON gas analyzers
- GAOS MS process mass spectrometry
- MaOS HiSpec ion mobility spectrometer
- MaOS AxiSpec ion mobility spectrometer
- Applications
- News
- Events
- About us
Optical system |
||
| Optical scheme |
Horizontal–symmetrical, astigmatism-compensated |
|
| F-number |
1/3.3 |
|
| Focal length |
99.3 mm |
|
| Objectives |
Achromatized, distortion-compensated |
|
| Flat field |
28 x 8 mm (20 x 8 mm with C-mount adapter) |
|
| Diffraction grating size |
40 x 40 x 6 mm |
|
| Stray light (20 nm from 632.8 nm laser line) |
9 х 10-4 |
|
Imaging |
||
| Horizontal magnification |
1.2 |
|
| Vertical magnification |
1 |
|
| Vertical spatial resolution |
50 μm |
|
Spectral slits |
||
| Control |
Manual, with micrometer screw |
|
| Opening width |
Smoothly regulated from 0 up to 2.0 mm |
|
| Parallelism |
± 1 µm |
|
| Accuracy (slit width 1 mm) |
± 10 µm |
|
| Repeatability |
± 1.5 µm |
|
| Reading accuracy (micrometer) |
2 µm |
|
Optics |
||
|
SL100M |
SL100M-UV |
|
|
Diffraction grating |
400 l/mm 500 nm |
400 l/mm 300 nm |
| Wavelengths range limited by the constructive parameters |
360 – 1100 nm |
200 – 1100 nm |
| Wavelengths range with diffraction grating efficiency >40% |
265 – 1000 nm |
200 – 600 nm |
| Reciprocal linear dispersion (at blaze wavelength) |
18.38 nm/mm |
19.21 nm/mm |
| Spectral resolution |
<0.35 nm |
<0.37 nm |
| Repeatability |
± 0.1 nm |
± 0.1 nm |
| Wavelength accuracy |
± 1 nm |
± 1 nm |
Dimensions and weight |
||
| Overall sizes (L x W x H) |
190 х 175 х 160 mm |
|
| Weight |
2 kg |
|
