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Configuration with 532 nm laser * |
Configuration with 785 nm laser * |
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Laser power |
50 mW
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130 mW |
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Laser attenuation |
1-100% with 1% step |
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Focal length |
120 mm |
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Entrance aperture |
40 µm |
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Grating |
1200 l/mm |
1800 l/mm |
600 l/mm |
1200 l/mm |
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Spectral resolution |
~7 cm-1 |
~4 cm-1 |
~7 cm-1 |
~3 cm-1 |
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Spectral range |
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- Edge/Notch filter |
70 – 4 700 cm-1 |
70 – 3 155 cm-1 |
50 – 3 200 cm-1 |
50 – 2 140 cm-1 |
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- Bragg filter |
10 – 4 700 cm-1 |
10 – 3 155 cm-1 |
N/A |
N/A |
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Detector |
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Detector type |
sCMOS |
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Pixel number |
4096 |
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Pixel size |
7x200 µm |
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Readout noise |
16 e- RMS |
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Dark current |
400 e-/pixel/s |
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Dynamic range |
5 000:1 |
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Peak sensitivity wavelength |
700 nm |
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Integration time |
1 ms – 60 s |
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Spatial resolution |
< 1 µm in the x and y directions (for 532 nm laser) |
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Confocal (z) resolution |
< 2 µm (for 532 nm laser) |
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PC connection interface |
USB 2.0 |
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Power supply |
100 – 240 VAC, 50 –60 Hz |
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Dimensions |
610 (650) x 500 x 650 mm |
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Weight |
~25 kg |
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Basic model |
Advanced model |
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Type |
Upright reflected |
Research grade upright |
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Modes |
Bright field |
Bright and dark field |
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Trinocular head |
10x eyepiece (diopter adjustable) |
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Objective turret |
Five-position |
Six-position |
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Reflection illumination |
LED sources with Kohler illumination system |
12V/100W halogen lamp |
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Diaphragms |
Iris field diaphragm and aperture diaphragm, central adjustable |
N/A |
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Polarizers |
Fixed polarizer (reflecting) and 360° rotatable analyzer (reflecting)
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N/A |
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Sample stage |
Manual, 76x42 mm (optional: motorized, 75x75 mm, step 0.1 µm) |
Manual, 102x105 mm (optional: motorized, 75x75 mm, step 0.1 µm) |
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Sample weight |
Up to 5 kg |
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